It improves throughput while maintaining compatibility with the established MBAV8 instrument. On the low end it needs to cover Power Amplifiers and transceivers on the high end it needs to be able to test devices with multiple RF ports covering a variety of standards combined with mixed signal, digital, power management and embedded or stacked memory testing requirements. Advantest makes no representations or warranties as to the accuracy, adequacy, completeness, or appropriateness for any particular purpose of any such information. ProgramGenerator. Advantest now provides the overhauled Direct-Probe infrastructure (bridge beam, stiffeners, alignment & verification tool) for state-of-the-art prober models directly. '.l!oUsV_Si/[I. ml`)>/d(2Z,KmZ&k)T\c,\h3M/(?Yb+4YhIV5Yhs~q The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. The user benefits are reduced test time, best repeatability and simplified program creation. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. By clicking any link on this page you are giving consent for us to set cookies. Each channel can provide up to 80V and 10 amps. All features and performance points are available in all classes. It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. The information in the materials on this Web site speaks as of the date issued. ; Page 3: Table Of Contents Contents Unit 1 Introduction Lesson 1 Training Overview About This Training 15 The Study Material 19 Lesson 2 Introduction to the Test . V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. Older testers having single clock domains and primitive With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. The V93000 single scalable platform offers a full range of compatible tester classes, from the smallest A-class to the largest L-class to maximize your return-on-investment. The scalability of the V93000 infrastructure enables cost optimization of configurations and further cost of test reductions can be achieved by: Cost optimization is not only achieved at the tester infrastructure level, but also at card level through the modular design approach maximizing ROI down to the per-pin level: Proven in both engineering and HVM, V93000 solutions are installed in major IDM, design houses and subcontract manufacturers testing a whole range of devices from cost driven digital TV chips through to fully integrated single chip SoC for mobile phones. 0000058694 00000 n Advantest does not, does not intend to, and expressly disclaims any duty to update or correct such information. Extends Highly Parallel Testing Capabilities. The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. 0000332614 00000 n 0000033307 00000 n Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. DC testing Shmoo tools, data logging, and histograms. The V93000 Port Scale RF architecture makes key contributions in several dimensions: WLCSP require test coverage of final test at probe to enable known good die testing. The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. 0000012694 00000 n Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. Superior x/y repeatability after cleaning step. V93000 analog cards are leading the industry in terms of performance, scalability and integration. Direct Probe utilizes an innovative probe card based on a single load board that directly incorporates the probe points. With greater multi-site testing, reduced index times (<1s) and faster test times, manufacturers can achieve the high throughput needed to drive down cost of test. All card types fit in all test heads, which provide the same power, cooling and computer interfacing to each card, independent of tester size. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. ATE to ATE Conversion. 0000058071 00000 n By clicking any link on this page you are giving consent for us to set cookies. Training needs are limited due to a single, familiar test system. New technologies consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the race to market. Advantest Corporation The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. The single load board can leverage existing final test designs and can be shared between wafer probe and final test, reducing hardware development time and hardware cost. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. Technical Documentation New trends in 3D packaging technologies push the envelope of test coverage at probe. A few months experience in testing digital ICs with the V93000 SOC test system; Familiarity with the programming language C++; Familiarity with analog and digital conversion circuits and their characteristics; Outcome: Understand how to make test plan develop test programs for mixed-signal devices You will know the how to: 11 0 obj <> endobj xref 11 73 0000000016 00000 n Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. Advantests V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Automation Solutions E-mail Kantor : spiuho@uho.ac.id Also, is a high precision VI resource for analog applications like power management. 0000079887 00000 n This paragraph applies only to the extent permitted by applicable law. 0000349795 00000 n The intent is to provide the skills required to utilize the V93000 tester platform as an integral tool in the engineering and production flows of semiconductor device manufacturing. The drive for more functions per die, the drive for power reduction to enable ever longer battery lifetime of mobile devices drives technology nodes. Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. The benchmar RF Test Solution for 4G and Beyond Productivity Designed to deliver high performance RF test capability for the complete spectrum of connectivity and mobility standards while offering new levels of manufacturing test efficiencies Extensive suite of new capabilities designed to provide the lowest cost of bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. Advantest Corporation The UltraPin1600 implements Teradyne's ground-breaking multicore, hardware-based Protocol Aware capability that allows individual pin groups to be saved to device data rate and timing and eliminates the need for digital patterns for programming standard data busses. Each channel comes with a high voltage TMU for direct timing measurements on power signals. RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. The Pin Scale 9G is the only fully integrated, high-speed, digital instrument covering the entire range from DC up to 8 Gigabits per second. %PDF-1.4 % Through our DMEA Trusted Source facilities that provide advanced packaging and electrical & environmental testing, to our counterfeit mitigation facility that ensures authenticity to specification, Micross offers unparalleled capabilities to support any . This combined with lowest cost of tests results in a widespread market acceptance of the V93000 RF solution and sets a new standard for testing next generation RF devices. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. Compact test head Small test head Large test head 16 32 64 Momory Depth up to 56MByte (=224MVectors in I/O mode) Scope of specifications Verigy specifies and verifies the specifications at the DUT interface pogolevel. Advantest 673 subscribers Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency. High density DPS for massive multi-site applications - extending the power supply versatility of the V93000. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. Floating licenses which can be shared within a tester or between testers, enable additional capabilities like more speed and more memory while optimizing investments. EVA100 Advantest Introduces New Module, Extending EVA100 Measurement System's Capabilities to Include High-Voltage Semiconductors AirLogger The latest SmartScale 93K systems provide new instrumentation and flexible licensing to lower your cost of test. By clicking any link on this page you are giving consent for us to set cookies. During card clamp operation, Direct-Probe Bridge Beam pushes and holds probe card alignment pins to the datum point, and constraints XY card movement. . Architecturally advanced cards provide the high parallelism and massive multi-site capabilities that allow customers to cost-effectively test current and upcoming generations of communication devices. The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. 0000031783 00000 n testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. Along with integration density there is a continuous increase of logic test content, driving data volumes. Wave Scale RF and Wave Scale MX cards help to create paths for testing 5G devices by delivering high-efficiency test solutions for the ICs used in both todays and emerging 5G NR (3GPP new radio), LTE, LTE-Advanced and LTE-A Pro smart phones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and IoT applications. The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. Auto Loading / Unloading Feature for Manual Equipment . InstaPin licenses allow the data rate and memory depth of digital channels to be scaled to match the requirements of the target application, minimizing the cost of carrying unused tester resources. Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. TSE: 6857. Engineering time is reduced through test program reuse. (-{Q&.v1xRYdI~.4 nd|7I:aN!OM ; Page 2 Agilent Technologies shall not be li- able for errors contained herein or consequential damages in connec- tion with the furnishing, perfor-. More information is available at www.advantest.com Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points.
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